1993, Saragusti, I., and Brande, S., Statistical and morphometric methods for shape analysis of bifacial tools: Advances in Morphometrics NATO Advanced Study Institute, Il Ciocco, Italy,Abstracts, p. 50
1992, Baarli, G. B., Brande, S., and Johnson, M. E., Proximality trends in the Red Mountain Formation (Lower Silurian) of Birmingham, Alabama. Oklahoma Geological Survey Bulletin v. 145, p. 1-17.
1991, Blatt, H., Berry, W. B. N., and Brande, S., Principles of StratigraphIC Analysis: Blackwell Scientific Publications, Boston.
1990, Brande, S., Statistical Studies, in Magill, F. (ed.), Magill's Survey of Science: Earth Science Series, p. 2469-2476.
1984, Brande, S., and McAnnally, C. W., Near-Recent sedimentologic history of Mobile Bay: Seismic and lithologic characteristics, in Tanner, W. F. (ed.), Sixth Symposium on Coastal Sedimentology, Proceedings: Department of Geology, Florida State University, Tallahassee, p.160-181.
1981[1982], Brande, S., Dinger, J. S., McAnnally, C. W., Miller, R., and Kindinger, J., Seismic survey of Mississippi Sound, Mississippi, and Mobile Bay, Alabama, in Kelly, J. R. (ed.), Symposium on Mississippi Sound: Mississippi-Alabama Sea Grant Publication 81-007, p. 105-115.
1982, Brande, S., Epibiont Analysis of the Fossil Interactions Among A Benthic Infaunal Bivalve, A Barnacle, and a Drilling Gastropod: Journal of Paleontology, v. 56, p. 1230-1234.
1982, Brande, S., and Bretsky, S. S., Avoid improper statistical analysis in bryozoans: Analysis of variance is suitable for study of hierarchical variation: Journal of Paleontology, v. 56, p. 1207-1212.
1981, Livi, K., Brande, S. O., and Bence, A. E., Highland chemistry: Major and trace element classification of rock types (abstract): Lunar and Planetary Science XII, p. 622-624. Lunar and Planetary Science Institute, Houston, Texas.
1980, Bence, A. E., Brande, S., Indelicato, G., and Allen, F., Analysis of trace and minor elements in rock-forming minerals using an automated electron probe, in Beaman, D. R., Ogilvie, R. E., and Wittry (eds.), Eighth International Conference on X-ray Optics and Microanalysis, Proceedings: p. 538-548.